It is a series project that introduces measurement and analysis techniques to everyone involved in Raman spectroscopy. Proper understanding of sample preparation, measurement condition settings, Raman spectrum analysis methods, etc. supports the realization of more effective Raman spectroscopy.
Describes how to use samples that can be measured with an optical microscope, pretreatments, and sample fixing props.
This chapter explains how to use an optical microscope (right-up) and how to focus quickly.
We introduce the concept of laser irradiation conditions, the change of spectrum due to various irradiation conditions, and the change of spectrum when the sample is burnt together with the measured data.
The relationship between the diffraction grating, the wavenumber range, and the spectral resolution, and the change in Raman spectrum and Raman image due to the slit width will be explained together with the measured data.
We will explain the noise generated by the CCD detector and how to reduce the noise and detect weak signals.
We will explain the relationship between the objective lens and the field of view, the difference in spatial resolution between the planar direction and the depth direction, and the application of the special objective lens.
7th: Acquire Raman Image
We introduce the measurement procedure of Raman image and the standard of the peak intensity necessary for Raman imaging measurement.
8th: How to make good Raman image.
Learn about the contrast adjustments needed to create a Raman image and how to use a lookup table (LUT).
9th: Confocal microscopy for depth imaging
We will explain confocal optics to make analysis in the depth direction appropriate.
10th: Refractive index mismatching for depth analysis
We will explain how much the effect of refractive index mismatch is present in depth direction analysis and how to choose an objective lens based on that effect.
11th:Measure in situ under heating and cooling
This chapter explains how to set the sample in the in-situ Raman measurement under heating / cooling and points to note when making measurements.
12th: In-situ Raman measurement case under heating and cooling
We introduce an example of in situ Raman measurement under heating of silicon and cooling of BaTiO3 and graphene.
13th: About the penetration depth of the light
In Raman analysis, I will explain how the difference in the penetration depth (penetration length) of light affects.
1st: Remove cosmic rays
We will explain the effect on the Raman spectrum and Raman image when cosmic rays enter, and the effect after removal.
2nd: Peak fit analysis of Raman spectrum
We will explain how to interpret the spectrum quantitatively by performing peak fit analysis.
3rd: Peak fit imaging for Raman imaging
From the appropriate data pre-processing when applying peak fit analysis to a Raman image, we will introduce examples of actual peak shift images and peak half-width images. In addition, in order to perform peak fit analysis correctly, the number of peak components required for fitting, background processing, and the relationship between signal-to-noise ratio and positioning accuracy are explained.
The contents of the series will be subject to change.